Linear Performance Testing instrument for Laser Photoelectric Detection System
Laser Film Damage Threshold Testing System
Infrared optical and imaging testing system
TV infrared image tracking performance meauring system
Large Diameter Collimator Tester
Field Portable Multi - Axis Parallelism calibrator
Portable Optical Performance Test System
Alarm capability/Detection Probability Test System
Infrared Guidance/Control Test System
Infrared Sensitivity Testing System
Multispectral Laser Spot spatial Distribution Field Measurement System
Si detector
Si detectors operate at wavelengths between 0.3 and 1.0 um. At room temperature, the product is highly
sensitive and supports accessories such as filters (long wave and bandpass filters), preamplifiers, and fiber
optic connectors.
Detector type | Active Dia (mm) | Shunt Resistanve ( | Shunt Capacitance pF),tpy | OperatingWavelength (nm) | Spectral Responsivity (A/W) | NEP (W/ Hz1/2 ) @800nm,1KHz |
LD-S-010 | 1.0 | 500 | 25 | 300-1000 | 0.55@850nm | <1.0x10-14 |
LD-UVS-010 | 1.0 | 500 | 50 | 200-1000 | 0.55@800nm | <1.0x10-14 |
LD-S-025 | 2.5 | 500 | 400 | 300-1000 | 0.55@850nm | <1.0x10-14 |
LD-UVS-025 | 2.5 | 200 | 300 | 200-1000 | 0.50@800nm | <1.5x10-14 |
LD-S-050 | 5 | 200 | 1500 | 350-1100 | 0.55@850nm | <1.5x10-14@850nm |
LD-UVS-050 | 5 | 50 | 1000 | 200-1100 | 0.50@800nm | <3.0x10-14@700nm |
LD-S-100 | 10 | 10 | 1000 | 350-1100 | 0.50@850nm | <1.0x10-13@850nm |
LD-UVS-100 | 10 | 50 | 1800 | 200-1000 | 0.50@800nm | <5x10-14@800nm |
LD-S-113 | 11.3 | 200 | 9000 | 300-1100 | 0.55@850nm | <1.5x10-14 |
LD-UVS-113 | 11.3 | 10 | 4000 | 200-1000 | 0.50@800nm | <1.0x10-13 |
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