Linear Performance Testing instrument for Laser Photoelectric Detection System
Laser Film Damage Threshold Testing System
Infrared optical and imaging testing system
TV infrared image tracking performance meauring system
Large Diameter Collimator Tester
Field Portable Multi - Axis Parallelism calibrator
Portable Optical Performance Test System
Alarm capability/Detection Probability Test System
Infrared Guidance/Control Test System
Infrared Sensitivity Testing System
Multispectral Laser Spot spatial Distribution Field Measurement System
InGaAs FPA detector,spectral range 900-1700nm/2200nm,actual pixel array 320x256
Model | FPA-320×256-C | FPA-320×256-K-TE1/TE2 | FPA-320×256-K-2.2-TE1/TE2 |
Sensor Technology | InGaAs | InGaAs | InGaAs |
Spectral Range | 0.9um-1.7um | 0.9um-1.7um | 1.2um-2.2um |
Actual Pixel Array | 320×256 | 320×256 | 320×256 |
Pixel Pitch | 30um | 30um | 30um |
Image Size | 9.6mm×7.68mm | 9.6mm×7.68mm | 9.6mm×7.68mm |
Package Type | 44-pin CLCC | 28-pin MDIP | 28-pin MDIP |
Weight | 1.6g | 24.6g/25.6g | 24.6g |
Pixel Operability | >99.5% | >99% | >97% |
Dark Current | <0.4pA | <=0.4pA | <=10pA |
Quantum Efficiency | >=70% | >=70% | >=70% |
Filling Rate | >99% | >99% | >99% |
Crosstalk | <1% | <1% | / |
Detectivity | >=5×1012J | >=5×1012J (TE1) >=7.5×1012J(TE2) | >=1×1012J |
Response Nonuniformity | <=10% | <=10% | <=40% |
Non-linearity(maximun deviation) | <=2% | <=2% | <=2% |
Maximum Pixel Rate | 10MHz | 10MHz | 10MHz |
Gain | High:13.3uV/e- Low:0.7 uV/e- | High:13.3uV/e- Low:0.7 uV/e- | High:13.3uV/e- Low:0.7 uV/e- |
Pixel Well Depth | High:170Ke- Low:3.5Me- | High:170Ke- Low:3.5Me- | High:170Ke- Low:3.5Me- |
TEC cooling | / | TE1/TE2 | TE1/TE2 |
Operating Temperature | -20°C—85°C | -20°C—85°C | -20°C—85°C |
Storage Temperature | -40°C—85°C | -40°C—85°C | -40°C—85°C |
Power Consumption | 175mw | 175mw** | 175mw** |
** uncooled